4.4 Article

The effect of SiO2 addition on structural, magnetic and electrical properties of strontium hexa-ferrites

Journal

JOURNAL OF CRYSTAL GROWTH
Volume 297, Issue 2, Pages 403-410

Publisher

ELSEVIER
DOI: 10.1016/j.jcrysgro.2006.10.191

Keywords

crystal structure; magnetic fields; surface structure; X-ray diffraction; dielectric materials; magnetic materials

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Sr-hexaferrites with the addition of SiO2 (0-2.0 wt%) have been prepared by the solid-state reaction method. The structural characterization of the samples confirmed the major phase of Sr-hexa-ferrite. The average grain size was found within the range of micron. The coercivity increased up to 1.5 wt% of silica addition and then decreased. Remanence has decreasing trend with the increase of silica percentage. The DC electrical properties were studied as a function of temperature. Activation energy and drift mobility were determined. The room temperature electrical resistivity increased from 5.95 x 10(8) to 1.76 x 10(9) (Omega-cm), which in turn increased the activation energy with the successive addition of SiO2. The dielectric properties as a function of frequency, under normal conditions, were also measured. From 80 Hz to 1 MHz the dielectric constants and loss factors remained within the range of 3340-12 and 5.75-0.21, respectively. (c) 2006 Elsevier B.V. All rights reserved.

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