Journal
JOURNAL OF MATERIALS CHEMISTRY
Volume 17, Issue 15, Pages 1458-1461Publisher
ROYAL SOC CHEMISTRY
DOI: 10.1039/b700505a
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Synchrotron X-ray diffraction from a nominally amorphous molecular semiconductor film reveals both the presence of intermediate-range order (IRO) corresponding to crystalline domains with an average size of a few nanometres, and the growth of these domains upon exposure of the film to moisture.
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