Journal
APPLIED PHYSICS LETTERS
Volume 90, Issue 2, Pages -Publisher
AMER INST PHYSICS
DOI: 10.1063/1.2430776
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The authors propose and demonstrate a simple nondestructive technique that allows characterizing precisely the thermal properties of semiconductor lasers. The method consists of performing transmission measurements with a probe beam end fire coupled into one of the waveguide facets. Fabry-Perot oscillations occur as the cavity temperature varies, allowing for a time-resolved characterization of heating and dissipation processes. This leads to a very accurate knowledge of the thermal behavior of a third-order-mode semiconductor laser proposed for intracavity nonlinear processes. (c) 2007 American Institute of Physics.
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