Journal
POLYMER
Volume 48, Issue 2, Pages 542-555Publisher
ELSEVIER SCI LTD
DOI: 10.1016/j.polymer.2006.11.030
Keywords
poly(ethylene terephthalate); X-ray diffraction; microhardness
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Glassy poly(ethylene terephthalate), uniaxially drawn at 25 degrees C (cold drawing) and at 90 degrees C (hot drawing), was crystallized in a taut state without shrinkage at 100 degrees C, 150 degrees C, 200 degrees C and 250 degrees C. The nanostructure and the mechanical proper-ties were surveyed by X-ray diffraction and microhardness. Small-angle X-ray diffraction diagrams reveal typical 4-point patterns characteristic of the cold-drawn samples, whereas 2-point patterns are observed for the hot-drawn ones. Comparison of the molecular and the nanolayer inclinations in both drawings suggests that a mutual supplementary relationship holds between the c-axis tilting and the lamellar inclination. The layer structure formation is discussed in the light of these results. In addition, a correlation between the nanostructure formation and the micromechanical properties is offered, highlighting the differences found between the hot- and the cold-drawn materials. (c) 2006 Elsevier Ltd. All rights reserved.
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