Journal
ADVANCED MATERIALS
Volume 19, Issue 2, Pages 215-+Publisher
WILEY-V C H VERLAG GMBH
DOI: 10.1002/adma.200601285
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The orientation and pi-interaction of the frontier layers of regioregular poly(3-hexyl-thiophene) at both the air and substrate interfaces are directly measured for the first time using near-edge X-ray absorption fine-structure spectroscopy for thin films cast from a series of solvents (see figure). Results suggest the already high hole mobility in this material is still substantially limited by disorder at the interfaces.
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