Journal
APPLIED PHYSICS LETTERS
Volume 90, Issue 6, Pages -Publisher
AMER INST PHYSICS
DOI: 10.1063/1.2450652
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Here the authors report systematic studies on the epitaxial growth and properties of Zn1-xCuxO (x=0.02-0.1) thin films deposited onto sapphire c-plane single crystals using pulsed-laser deposition. X-ray diffraction and high resolution transmission electron microscopy (HRTEM) were employed to study the epitaxial relations of Zn1-xCuxO with the substrate, and x-ray photoelectron spectroscopy was used to establish the bonding characteristics and oxidation states of copper inside the ZnO host. Room temperature ferromagnetism was observed in the Zn1-xCuxO films with magnetic moment per Cu atom decreasing with an increasing Cu content. The presence of any magnetic phase was ruled out using HRTEM. Thus, the ferromagnetism was attributed to Cu ions substituted into the ZnO lattice. (c) 2007 American Institute of Physics.
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