4.6 Article

Thermally managed eclipse Z-scan

Journal

OPTICS EXPRESS
Volume 15, Issue 4, Pages 1712-1717

Publisher

Optica Publishing Group
DOI: 10.1364/OE.15.001712

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We report a new variation of the conventional Z-scan method to characterize the third-order optical nonlinearity of photonic materials. By exploiting the combination of the eclipse Z-scan with a thermal nonlinearity management technique, we demonstrate an improvement in sensitivity and flexibility of the method to simultaneously characterize the thermal and nonthermal nonlinearity of optical materials. The method is demonstrated by measuring the nonlinear refractive index in CS2, SiO2 and H2O, standard materials, and also in a biomaterial, the amino acid Tryptophan in water solution, using a femtosecond Ti-Sapphire laser operating at 76MHz repetition rate. (c) 2007 Optical Society of America.

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