Journal
APPLIED PHYSICS LETTERS
Volume 90, Issue 10, Pages -Publisher
AMER INST PHYSICS
DOI: 10.1063/1.2711770
Keywords
-
Categories
Ask authors/readers for more resources
The authors have measured noise in thin-film superconducting coplanar waveguide resonators. This noise appears entirely as phase noise, equivalent to a jitter of the resonance frequency. In contrast, amplitude fluctuations are not observed at the sensitivity of their measurement. The ratio between the noise power in the phase and amplitude directions is large, in excess of 30 dB. These results have important implications for resonant readouts of various devices such as detectors, amplifiers, and qubits. They suggest that the phase noise is due to two-level systems in dielectric materials. (c) 2007 American Institute of Physics.
Authors
I am an author on this paper
Click your name to claim this paper and add it to your profile.
Reviews
Recommended
No Data Available