Journal
ANGEWANDTE CHEMIE-INTERNATIONAL EDITION
Volume 48, Issue 3, Pages 543-546Publisher
WILEY-V C H VERLAG GMBH
DOI: 10.1002/anie.200803520
Keywords
antisite defects; crystal engineering; electron microscopy; solid-state structures
Categories
Funding
- Korea Research Foundation [KRF 2008-331-D00249]