Journal
JOURNAL OF APPLIED CRYSTALLOGRAPHY
Volume 40, Issue -, Pages S549-S552Publisher
BLACKWELL PUBLISHING
DOI: 10.1107/S0021889807011740
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Morphological change of in situ generated silica particles was investigated by a time-resolved two-dimensional small-angle X-ray scattering technique and a simultaneous tensile measurement. The in situ silica particles with diameter ca 34 nm were homogeneously dispersed in a rubbery matrix and the morphological change of the particles was followed up to the elongation ratio alpha = 2 during stretching and from alpha = 2.5 during retracting. The observed two-dimensional small-angle X-ray scattering patterns agreed with the simulation results by Rharbi et al. [Europhys. Lett. (1999), 46, 472-478] where a shear displacement model was proposed for the deformation mode of their soft nanocomposite.
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