Journal
ADVANCED MATERIALS
Volume 19, Issue 7, Pages 925-+Publisher
WILEY-V C H VERLAG GMBH
DOI: 10.1002/adma.200601762
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Silicon/silicon oxide interfaces are found to possess magnetic properties when the surface is etched to a specific morphology. By measuring the surface roughness (see figure) using atomic force microscopy, and monitoring the magnetic response as a function of magnetic field, the relation between the magnetism and the surface structure is established. The observations indicate that the magnetism is related to a cooperative effect on the surface.
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