Journal
ELECTROCHIMICA ACTA
Volume 52, Issue 15, Pages 4899-4906Publisher
PERGAMON-ELSEVIER SCIENCE LTD
DOI: 10.1016/j.electacta.2007.01.054
Keywords
niobium oxide thin films; spray pyrolysis technique; scanning electron microscopy (SEM); X-ray diffraction (XRD); atomic force microscopy (AFM)
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Niobium oxide thin films were deposited on the glass and fluorine doped tin oxide (FTO) coated glass substrates using simple and inexpensive spray pyrolysis technique. During deposition of the films various process parameters like nozzle to substrate distance, spray rate, concentration of sprayed solution were optimized to obtain well adherent and transparent films. The films prepared were further annealed and effect of post annealing on the structural, morphological, optical and electrochromic properties was studied. Structural and morphological characterizations of the films were carried out using scanning electron microscopy, atomic force microscopy and X-ray diffraction techniques. Electrochemical properties of the niobium oxide thin films were studied by using cyclic-voltammetry, chronoamperometry and chronocoulometry. (c) 2007 Elsevier Ltd. All rights reserved.
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