4.6 Article

Focused ion beam micro- and nanoengineering

Journal

MRS BULLETIN
Volume 32, Issue 5, Pages 417-423

Publisher

CAMBRIDGE UNIV PRESS
DOI: 10.1557/mrs2007.65

Keywords

-

Ask authors/readers for more resources

This article discusses applications of focused ion beam micro- and nanofabrication. Emphasis is placed on illustrating the versatility of focused ion beam and dual-platform systems and how they complement conventional processing techniques. The article is divided into four parts: maskless milling, ion beam lithography, ion implantation, and techniques such as in situ micromanipulation.

Authors

I am an author on this paper
Click your name to claim this paper and add it to your profile.

Reviews

Primary Rating

4.6
Not enough ratings

Secondary Ratings

Novelty
-
Significance
-
Scientific rigor
-
Rate this paper

Recommended

No Data Available
No Data Available