Journal
ANALYTICAL CHEMISTRY
Volume 85, Issue 21, Pages 10519-10525Publisher
AMER CHEMICAL SOC
DOI: 10.1021/ac402521u
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Funding
- KAIST
- Korean Ministry of Education, Science and Technology (MEST)
- National Research Foundation [2009-0087691, 2012R1A1A1009082, 2012K1A31A1A09055128, 2012-M3C1A1-048860, 2013M3C1A3063600]
- TJ ChungAm Foundation
- National Research Foundation of Korea [2013M3C1A3063600] Funding Source: Korea Institute of Science & Technology Information (KISTI), National Science & Technology Information Service (NTIS)
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We present a novel spectroscopic quantitative phase imaging technique with a wavelength swept-source, referred to as swept-source diffraction phase microscopy (ssDPM), for quantifying the optical dispersion of microscopic individual samples. Employing the swept-source and the principle of common-path interferometry, ssDPM measures the multispectral full-field quantitative phase imaging and spectroscopic microrefractometry of transparent microscopic samples in the visible spectrum with a wavelength range of 450-750 nm and a spectral resolution of less than 8 nm. With unprecedented precision and sensitivity, we demonstrate the quantitative spectroscopic microrefractometry of individual polystyrene beads, 30% bovine serum albumin solution, and healthy human red blood cells.
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