Journal
APPLIED SURFACE SCIENCE
Volume 253, Issue 17, Pages 7172-7177Publisher
ELSEVIER SCIENCE BV
DOI: 10.1016/j.apsusc.2007.02.186
Keywords
cerium oxide; thickness effect; biaxial textures; YBCO coated conductors; laser ablation
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Biaxially textured YBa2CU3O7-x, (YBCO) films were grown on inclined-substrate-deposited (ISD) MgO-textured metal substrates by pulsed laser deposition. CeO2 was deposited as a buffer layer prior to YBCO growth. CeO2 layers of different thickness were prepared to evaluate the thickness dependence of the YBCO films. The biaxial alignment features of the films were examined by X-ray diffraction 2 theta-scans, pole-figure, phi-scans and rocking curves of Omega angles. The significant influence of the CeO2 thickness on the structure and properties of the YBCO films were demonstrated and the optimal thickness was found to be about 10 nm. High values of T-c = 91 K and J(c) = 5.5 x 10(5) A/cm(2) were obtained on YBCO films with optimal CeO2 thickness at 77 K in zero field. The possible mechanisms responsible for the dependence of the structure and the properties of the YBCO films on the thickness of the CeO2 buffer layers are discussed. (c) 2007 Elsevier B. V.. All rights reserved.
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