Journal
NANO LETTERS
Volume 7, Issue 7, Pages 2146-2151Publisher
AMER CHEMICAL SOC
DOI: 10.1021/nl070863r
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Individual multiwalled boron nitride nanotubes of different diameters (40-100 nm) were bent inside a 300 kV high-resolution transmission electron microscope (TEM) using a new fully integrated TEM-atomic force microscope (AFM) piezodriven holder under continuous recording of force-piezodisplacement curves. The tubes were gently compressed in situ (i.e., inside the electron microscope) between a piezomovable aluminum wire and a silicon cantilever. Typically, bending stress values ranging from similar to 100 to similar to 260 MPa, and corresponding to elastic moduli of 0.5-0.6 TPa, were estimated. Tube gross failures were absent up to very large bending angles (in excess of 115 degrees). Extending the bending angles beyond 30-40 degrees resulted in the elastic deformation of BN nanotubes, which proceeded through the propagation of consecutive momentary kinks. These had the effect of accumulating a bending curvature rather then uniformly curl the tube under the compression load. These kinks were found to be entirely reversible on reloading with no (or marginal) traces of residual plastic deformation.
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