Journal
ANALYTICAL CHEMISTRY
Volume 84, Issue 23, Pages 10380-10387Publisher
AMER CHEMICAL SOC
DOI: 10.1021/ac302598r
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Funding
- U.S. Department of Energy through the LANL/LDRD Program
- DOE Office of Basic Energy Sciences
- Los Alamos National Laboratory under DOE [DE-AC52-06NA25396]
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A unique approach to detect chemical speciation and distribution on nanometer-scale nuclear materials has been achieved by the combination of neutron reflectometry and shell-isolated surface-enhanced Raman spectroscopy. Both surface and underlying layers of the uranium oxide materials were determined with angstrom-level resolution. Our results reveal that the UOx film is composed of three sublayers: an, similar to 38 angstrom thick layer of U3O8 formed along the UOx/substrate interface; the adjacent sublayer consists of an similar to 900 angstrom thick single phase of alpha-UO3, and the top layer is gamma-UO3 with a thickness of similar to 115 angstrom.
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