The mixed mode I and II interface crack in piezoelectromagneto-elastic anisotropic bimaterials

Taking the electric-magnetic field inside the interface crack into account, the interface crack problem of dissimilar piezoelectromagneto (PEMO)-elastic anisotropic bimaterials under in-plane deformation is investigated. The conditions to decouple the in-plane and anti-plane deformation is presented for PEMO-elastic biaterials with a symmetry plane. Using the extended Stroh's dislocation theory of two-dimensional space and the analytic continuition principle of complex analysis,. the interface crack problem is turned into a nonhomogeneous Hilbert equation in matrix notation. Four possible eigenvalues as well as four eigenvectors for the fundamental solution to the corresponding homogeneous Hilbert equation are found, so are four modes of singularities for the fields around the interface crack tip. These singularities are shown to have forms of r(1)(-(1/2)+/- i epsilon), and r(2)(-(1/2)+/-epsilon), in which the bimaterial constants epsilon(1) and epsilon(2) are proven to be real numbers for practical dissimilar PEMO-elastic bimaterials. Compared with the solution for the interface crack of dissimilar elastic bimaterials without electro-magnetic properties, two new additional singularities are discovered for the interface crack in the PEMO-elastic bimaterial media. The electric-magnetic field inside the crack is solved by employing the energy method, which is based on finding the stationary point of the saddle surface of the energy release rate with respect to the electro-magnetic field inside the crack. Closed form expressions for the extended crack tip stress fields and crack open displacements are formulated, so are some other fracture characteristic parameters, such as the extended stress intensity,factors and energy release rate (G) for dissimilar PEMO-elastic bimaterial solids. Finally, fundamental results and some conclusions are presented, which could have applications in the failure of piezoelectro/magneto-elastic devices.