Journal
ANALYTICAL CHEMISTRY
Volume 83, Issue 6, Pages 1985-1989Publisher
AMER CHEMICAL SOC
DOI: 10.1021/ac102687u
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Funding
- Slovak Research and Development Agency [LPP-0143-06, SK-CN-0015-09, 1/0051/08]
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The ability of the ion mobility spectrometry (IMS) technique with a negative corona discharge (CD) ion source to detect trace amounts of impurities in high-purity O-2 has been explored. The processes of the formation of negative ions in negative CD IMS have been studied using the ion mobility spectrometry/mass spectrometry (IMS/MS) technique. The CD IMS and CD IMS/MS spectra of 5.0 and 6.0 oxygen with and without additional purification (CO2 and H2O removal) have been measured. It has been proven that the trace amounts of N-2 in high-purity O-2 can be monitored using the CD IMS and/or CD IMS/MS technique.
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