Ion Mobility Spectrometry for Monitoring High-Purity Oxygen

The ability of the ion mobility spectrometry (IMS) technique with a negative corona discharge (CD) ion source to detect trace amounts of impurities in high-purity O-2 has been explored. The processes of the formation of negative ions in negative CD IMS have been studied using the ion mobility spectrometry/mass spectrometry (IMS/MS) technique. The CD IMS and CD IMS/MS spectra of 5.0 and 6.0 oxygen with and without additional purification (CO2 and H2O removal) have been measured. It has been proven that the trace amounts of N-2 in high-purity O-2 can be monitored using the CD IMS and/or CD IMS/MS technique.