Journal
ANALYTICAL CHEMISTRY
Volume 80, Issue 21, Pages 8299-8307Publisher
AMER CHEMICAL SOC
DOI: 10.1021/ac801512n
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Funding
- United States Air Force Office of Scientific Research [FA9550-04-1-0076]
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We have designed and constructed a continuous imaging reflectron time-of-flight mass spectrometer (TOFMS) that provides a mass spectrum at every pixel of a two-dimensional image with a 100% duty cycle. The technique is based on pseudorandom ion beam modulation and three-dimensional (x, y, t) ion imaging. We use a multi-channel plate detector with a delay-line anode that provides x, y positions and flight times t of every ion arrival event. The precision of the peak heights in the 100% duty cycle mass spectra is shown to be enhanced even at short (10 ms) acquisition times, which should prove useful for the study of solution kinetics or fast chromatographic separations. As a demonstration of the system's capability, we have imaged the fragmented ions that underwent surface-induced dissociation inside the reflectron and the ions that fragmented spontaneously through postsource decay.
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