Topology measurements of metal nanoparticles with 1 nm accuracy by confocal interference scattering microscopy

We present a novel scattering microscopy method to detect the orientation of individual silver nanorods and to measure their relative distances. Using confocal microscopy in combination with either the fundamental or higher order laser modes, scattering images of silver nanorods were recorded. The distance between two individual nanorods was measured with an accuracy in the order of 1 nm. We detected the orientation of isolated silver nanorods with a precision of 0.5 degree that corresponds to a rotational arch of about 1 nm. The results demonstrate the potential of the technique for the visualization of non-bleaching labels in biosciences. (c) 2007 Optical Society of America