4.4 Article Proceedings Paper

Polarity dependence of AlN {0001} decomposition in flowing H2

Journal

JOURNAL OF CRYSTAL GROWTH
Volume 305, Issue 2, Pages 366-371

Publisher

ELSEVIER
DOI: 10.1016/j.jcrysgro.2007.04.005

Keywords

surface processes; vapor phase epitaxy; nitrides; semiconducting aluminum compounds

Ask authors/readers for more resources

The thermal stabilities of Al- and N-polarity AIN layers grown on (0 0 0 1) sapphire substrates were investigated at temperatures ranging from I 100 to 1400 degrees C in various gas flows (He, H-2 and H-2 + NH3). Decomposition of AIN occurred in flowing H,, while it did not occur in He or H-2 + NH3 flow. The decomposition rate in H, increased with an increase in the temperature over 1200 degrees C, and the decomposition rate of the M-polarity AIN layer was found to be lower than that of the N-polarity AIN layer at each temperature. The decomposition reaction of AIN and the relationship between the polarities of the AIN layers and their different decomposition rates are discussed. (c) 2007 Elsevier B. V. All rights reserved.

Authors

I am an author on this paper
Click your name to claim this paper and add it to your profile.

Reviews

Primary Rating

4.4
Not enough ratings

Secondary Ratings

Novelty
-
Significance
-
Scientific rigor
-
Rate this paper

Recommended

No Data Available
No Data Available