☆ 4.7 Article Proceedings Paper

Thermal oxidation of single crystalline aluminum nitride

MATERIALS CHARACTERIZATION (2007)

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Journal

MATERIALS CHARACTERIZATION
Volume 58, Issue 8-9, Pages 672-679

Publisher

ELSEVIER SCIENCE INC
DOI: 10.1016/j.matchar.2006.11.013

Keywords

high resolution transmission electron microscopy; electron energy loss spectroscopy; oxidized aluminum nitride; stacking faults; dislocations

Categories

Materials Science, Multidisciplinary Metallurgy & Metallurgical Engineering Materials Science, Characterization & Testing

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