Journal
SEMICONDUCTOR SCIENCE AND TECHNOLOGY
Volume 22, Issue 8, Pages 851-854Publisher
IOP PUBLISHING LTD
DOI: 10.1088/0268-1242/22/8/003
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We have identically prepared Au/n-InP/In Schottky barrier diodes (SBDs). The barrier height for the Au/n-InP/In SBDs from the current-voltage characteristics has varied from 0.557 eV to 0.615 eV, and the ideality factor n from 1.002 to 1.087. We have determined a lateral homogeneous barrier height value of approximately 0.597 eV for the Au/n-InP/In SBD from the experimental linear relationship between barrier heights and ideality factors. The barrier height value obtained from the reverse bias C-2-V characteristics has varied from 0.512 eV to 0.572 eV and statistical analysis yields the mean Phi(C-V) = 0.562 +/- 0.004 eV. A doping density of about (2.90 +/- 0.05) x 10(15) cm(-3) has been determined from the reverse bias C-2-V characteristics.
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