Journal
IEEE TRANSACTIONS ON ELECTROMAGNETIC COMPATIBILITY
Volume 49, Issue 3, Pages 485-493Publisher
IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC
DOI: 10.1109/TEMC.2007.902194
Keywords
component; electric field; electromgnetic compatibility (EMC); magnetic field; near-field measurement; probe
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A completely automatic near-field mapping system has been developed within the Research Institute for Electronic Embedded Systems (IRSEEM) in order to determine the electromagnetic field created by electronic systems and components. This test bench uses a 3-D positioning system of the probe to make accurate measurements. This paper presents some applications of the near-field techniques in EMC investigations. In the first part, near-field measurements are used to locate precisely the electromagnetic sources of a limiter device. In the second part, we present an equivalent model of the radiated emission of an integrated circuit. In the last part, the near-field test bench is used to characterize faults in a cable.
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