Journal
OPTICAL MATERIALS
Volume 29, Issue 12, Pages 1871-1877Publisher
ELSEVIER SCIENCE BV
DOI: 10.1016/j.optmat.2006.10.015
Keywords
m-lines; composite waveguides; PZT
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The optical properties of lead zirconate titanate (PZT) thin films deposited on ZnO were studied by m-lines spectroscopy. In order to retrieve the refractive index and the thickness of both layers from the m-lines spectra, we develop a numerical algorithm for the case of a two-layer system and show its robustness in the presence of noise. The sensitivity of the algorithm of the two-layer model allows us to relate the observed changes in the PZT refractive index to the PZT structural change due to the ZnO interface of the PZT/ZnO optical waveguide. (c) 2006 Elsevier B.V. All rights reserved.
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