Journal
JOURNAL OF SOL-GEL SCIENCE AND TECHNOLOGY
Volume 43, Issue 2, Pages 171-177Publisher
SPRINGER
DOI: 10.1007/s10971-007-1574-2
Keywords
atomic force microscopy; sol-gel method; zinc oxide; cathodoluminescence
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Thin films of ZnO were grown by the sol-gel method using spin-coating technique on (0001) sapphire substrates. The effect of doping after annealing on the structural and optical properties has been investigated by means of X-ray diffraction (XRD), cathodoluminescence (CL) spectrum, scanning electron microscopy (SEM) and atomic force microscopy (AFM). The films that were dried at 623 K and then post annealed at 873 K showed (0002) as the predominant orientation. Two emission bands have been observed from CL spectrum. Lithium doped film shows shift in the near band edge UltraViolet emission peak and suppressed defect level emission peak in the visible range. SEM analysis of the films exhibits many spherical shaped nanoparticles. Roughness of the films determined using atomic force microscopy.
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