Journal
JOURNAL OF APPLIED CRYSTALLOGRAPHY
Volume 40, Issue -, Pages 782-785Publisher
BLACKWELL PUBLISHING
DOI: 10.1107/S002188980702420X
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The program ORNL_SAS calculates solution small-angle X-ray and neutron scattering intensity profiles from a wide variety of structures, including atomic-resolution models of proteins and protein complexes, low-resolution models defined in any manner, or combinations of both. ORNL_SAS is capable of simultaneously generating multiple intensity profiles, such as a contrast-variation series, and evaluating the quality of the fit of the model profiles to experimental data in a single run of the program. The capabilities of the widely applicable approach make it possible to use ORNL_SAS as the intensity calculation engine of model-building applications for small-angle scattering data.
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