Journal
OPTICS COMMUNICATIONS
Volume 277, Issue 1, Pages 14-18Publisher
ELSEVIER
DOI: 10.1016/j.optcom.2007.04.045
Keywords
Moire interferometry; ferroelectric; thermal expansion
Categories
Ask authors/readers for more resources
A moire interferometer is used to measure the thermal expansion of two ferroelectric crystals, LiNbO3 and KTiOPO4. The crystal samples are patterned with a chromium reflective grating and used as a diffractive component in a reflective grating interferometer. The thermal expansion of all the three axes of congruent LiNbO3 and of x and y axes of the flux-grown KTiOPO4 were measured from room temperature to 200 degrees C. For this temperature range the thermal expansion coefficient has been modeled by a second-order polynomial and its coefficients have been estimated by accurate analysis of the resulting moire fringe pattern. (C) 2007 Elsevier B.V. All rights reserved.
Authors
I am an author on this paper
Click your name to claim this paper and add it to your profile.
Reviews
Recommended
No Data Available