Journal
IEEE TRANSACTIONS ON MAGNETICS
Volume 43, Issue 9, Pages 3652-3655Publisher
IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC
DOI: 10.1109/TMAG.2007.900979
Keywords
Bi : YIG film; coercive force; recurrent rapid thermal annealing; RF magnetron sputtering; saturation magnetization
Ask authors/readers for more resources
We deposited amorphous Bi:YIG film on Si substrates by radio-frequency (RF) magnetron sputtering and crystallized it by the recurrent rapid thermal annealing (RRTA) method. We studied the effects of heating temperature on the crystallization, surface condition, and magnetic properties of the films using X-ray diffraction, an atomic force microscope, and a vibrating sample magnetometer. We also examined the effects of atmosphere and the recurrent-period on the films. Our results show that the RRTA method yields film with good magnetic properties, with saturation magnetization of 1750 Gs and coercive force of 80 Oe and good surface condition.
Authors
I am an author on this paper
Click your name to claim this paper and add it to your profile.
Reviews
Recommended
No Data Available