Journal
MICROELECTRONIC ENGINEERING
Volume 84, Issue 9-10, Pages 1994-1997Publisher
ELSEVIER SCIENCE BV
DOI: 10.1016/j.mee.2007.04.078
Keywords
metallic nanoparticles; non volatile memory; PVD
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In this work we investigate the non-volatile memory behavior of Ni nanoparticles embedded within an insulating matrix. Nickel nanoparticles are deposited at room temperature by a new high-vacuum technique over a 4 nm tunneling thermal SiO2 layer followed by the deposition of HfO2 as a control insulator. Memory windows of -> 1.5V are observed in MOS capacitors at gate pulse voltages of 8V. Charge retention for write and erase state clearly indicate long time charge storage behavior.
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