Journal
SURFACE SCIENCE
Volume 601, Issue 18, Pages 4074-4077Publisher
ELSEVIER
DOI: 10.1016/j.susc.2007.04.055
Keywords
near edge extended X-ray absorption fine structure; surface electronic phenomena; alkanes; copper; nickel
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The electronic structure of an octane film grown on Cu(1 1 1) and Ni(1 1 1) was studied using C K-edge near edge X-ray absorption fine structure (NEXAFS). A pre-peak was observed on the bulk edge onset for the 1 ML thick octane films on the metal substrates. The prepeak originated from metal induced gap states (MIGS) in the band gap of octane. The intensity of the pre-peak for octane/Ni(1 1 1) was the same as that of octane/Cu(1 1 1), suggesting that there was little difference in the density of unoccupied MIGS between the octane film on Ni(1 1 1) and Cu(1 1 1). We discuss the metal dependence of the density of unoccupied MIGS on the band structure of the metals. (C) 2007 Elsevier B.V. All rights reserved.
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