Elemental mapping by means of an ultra-fast XRF spectrometer based on a novel high-performance monolithic array of Silicon Drift Detectors

This paper describes the design of a novel X-ray fluorescence spectrometer and presents its performance in elemental mapping applications. The spectrometer is based on a new ring-shaped monolithic array of four independent high-performance Silicon Drift Detectors (SDDs). These detectors and the innovative geometry of the spectrometer setup with a polycapillary lens coupled with a low-power X-ray generator allow reaching fast elemental mapping. Moreover, dedicated data acquisition system has been designed and developed in order to fully exploit the detection rate performance of the detector. The spectrometer can be used in several applications in the field of industrial technology, geology, scientific research and works of art analyses. In particular, in the field of bio-chemical sciences the spectrometer exploits its performance in imaging analysis of elements present in very low concentrations. (c) 2007 Elsevier B.V. All rights reserved.