Journal
IEEE TRANSACTIONS ON DIELECTRICS AND ELECTRICAL INSULATION
Volume 14, Issue 5, Pages 1295-1301Publisher
IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC
DOI: 10.1109/TDEI.2007.4339492
Keywords
metallized film capacitor; irradiation; antioxidant; breakdown
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The effect of altered products of the antioxidant by UV irradiation on dielectric breakdown strength of metallized biaxially-oriented polypropylene (BOPP) capacitor film was studied. Results from Weibull statistical analysis show that an optimal UV exposure level of similar to 3.4 J/cm(2) (200-400 nm) increases the breakdown strength at 5% probability by similar to 20%. As indicated by UV spectroscopic analysis, the antioxidant in BOPP was consumed almost entirely to form 2,6-di-tert-butyl-p-benzoquinone (2,6-DTB-PBQ). Density functional theory computations indicate that this compound is electronegative, which probably accounts for the increased dielectric strength.
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