Determination of homogeneous and inhomogeneous broadening in semiconductor nanostructures by two-dimensional Fourier-transform optical spectroscopy

The imaginary part of two-dimensional Fourier-transform spectra in the rephasing and nonrephasing modes is used to analyze the homogeneous and inhomogeneous broadening of excitonic resonances in semiconductor nanostructures. Microscopic calculations that include heavy- and light-hole excitons as well as coherent biexcitonic many-body correlations reveal distinct differences between the rephasing and nonrephasing spectra. A procedure is proposed that allows separation of disorder-induced broadening in complex systems that show several coupled resonances.