The use of the Sawyer-Tower method and its modifications to measure the electrical parameters of ferroelectric materials

Modifications of the Sawyer-Tower method, based on a measurement of the impedance and Fourier transformations, are proposed. A functional and metrological analysis of the methods is presented, which enables the reliability of the measurements of the field dependences of the parameters of ferroelectric materials to be increased, which should find application in microelectronic and nanoelectronic products.