Journal
ULTRAMICROSCOPY
Volume 107, Issue 12, Pages 1159-1170Publisher
ELSEVIER SCIENCE BV
DOI: 10.1016/j.ultramic.2007.01.017
Keywords
diffraction imaging; phase retrieval; electron diffraction; nanoparticles; transmission electron microscopy
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A simulation study is carried out to elucidate the effects of dynamical scattering, electron beam convergence angle and detection noise on atomic resolution diffraction imaging of small particles and to develop effective reconstruction procedures. Au nanoclusters are used as model because of their strong scattering. The results show that the dynamical effects of electron diffraction place a limit on the size of Au nanoclusters that can be reconstructed from the diffraction intensities with sufficient accuracy. For smaller Au nanoclusters, the simulations show that diffraction patterns recorded under the experimental conditions can be reconstructed using a combination of phase retrieval algorithms. The use of a low-resolution image is shown to be effective for reconstructing diffraction patterns without the central beam. A new algorithm for estimating the object support is proposed. (c) 2007 Elsevier B.V. All rights reserved.
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