Journal
PHYSICAL REVIEW B
Volume 76, Issue 24, Pages -Publisher
AMER PHYSICAL SOC
DOI: 10.1103/PhysRevB.76.241404
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In situ surface x-ray scattering is used to determine the stable oxygen-induced surface structure on Cu(001) at high temperatures and under equilibrium oxygen pressure. The structure is composed of a c(2x2)-O adlayer atop a randomly 3/4-filled Cu layer for temperatures between 473 and 1000 K. Below 473 K, the vacancies in the topmost Cu layer order to form a (2 root 2x root 2)R45 degrees missing row structure. This order-disorder transition is confirmed by first-principles calculations.
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