Journal
BUNSEKI KAGAKU
Volume 56, Issue 12, Pages 1053-1061Publisher
JAPAN SOC ANALYTICAL CHEMISTRY
DOI: 10.2116/bunsekikagaku.56.1053
Keywords
food analysis; environmental regulation; trace element analysis; spinach leaves; provenance analysis
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An X-ray fluorescence (XRF) technique has been developed for analyses of trace elements in vegetables utilizing an energy-dispersive XRF spectrometer equipped with 3-dimensional polarization optics and secondary targets. Quantitative analyses were optimized with the calibration-curve method and the FP method based on the XRF intensity, normalized by that of Compton scattering. Various trace elements in spinach leaves grown at two major production sites, Gift] and Gunma prefectures, Japan, were successfully quantified by an easy sample-preparation technique over a wide concentration range from a few wt% (e.g. K and Ca) to sub-ppm (e.g. Cd and Ba) level. It was possible to clearly characterize the production locality of the spinach by statistical analysis of the trace characteristic elements, such as Ca, Zn, Br, Rb, Mo, and Ba. In addition, it was found that this XRF technique is suitable for rapid and easy screening analysis of Cd in vegetables at their production sites for the environmental regulation requirements.
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