4.7 Article

Hydrogen sensing performance of a nickel oxide (NiO) thin film-based device

Journal

INTERNATIONAL JOURNAL OF HYDROGEN ENERGY
Volume 40, Issue 1, Pages 729-734

Publisher

PERGAMON-ELSEVIER SCIENCE LTD
DOI: 10.1016/j.ijhydene.2014.10.142

Keywords

NiO thin film; RF sputtering; Sensing response ratio; Response (recovery) time constant; Resistance; H-2 sensor

Funding

  1. Ministry of Science and Technology of the Republic of China [NSC-100-2221-E-006-044-MY3, NSC-101-2221-E-006-142-MY3]

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An interesting nickel oxide (NiO) thin film-based hydrogen sensor device, prepared by a low-powered (50 W) radio-frequency (RP) sputtering process, is studied and demonstrated. The studied device shows improved performance including a very high hydrogen sensing response ratio (416 (Delta R/R)), an extremely low detecting limit (<50 ppm H-2/air), a high sensing response speed (7 s), a lower operating temperature (<= 350 degrees C) and a widespread sensing range of hydrogen concentration (50-10,000 ppm H-2/air). In addition, the device demonstrates benefits of low cost, easy fabrication and chemical stability. Based on these advantages, therefore, the studied NiO thin film sensor device shows promise for high-performance hydrogen sensing applications. Copyright (C) 2014, Hydrogen Energy Publications, LLC. Published by Elsevier Ltd. All rights reserved.

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