4.5 Article

Low-Temperature Sintering and Electrical Properties of 0.5Pb (Ni1/3Nb2/3)O3-0.35PbTiO3-0.15PbZrO3 Thick Films

Journal

INTERNATIONAL JOURNAL OF APPLIED CERAMIC TECHNOLOGY
Volume 12, Issue -, Pages E139-E145

Publisher

WILEY-BLACKWELL
DOI: 10.1111/ijac.12383

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The effect of sintering time on phase, grain size, dielectric, ferroelectric, and piezoelectric properties of 0.5Pb(Ni1/3Nb2/3) O-3-0.35PbTiO(3)-0.15PbZrO(3) thick films has been investigated. The thick films used in this study were fabricated by a double-doctor-blade tape-casting technique. Green tapes were sintered at relatively low sintering temperature of 1050 degrees C for 6, 8, 10, and 12 h. Among these, tapes sintered for 10 h were found to exhibit better electrical properties. Based on the obtained properties, prepared thick films could be categorized as soft piezoelectric materials and may be used for fabricating sensors, low-power transducers, and actuators.

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