Journal
ADVANCED MATERIALS
Volume 25, Issue 16, Pages 2333-2338Publisher
WILEY-V C H VERLAG GMBH
DOI: 10.1002/adma.201204555
Keywords
polar oxide interfaces; LAO; STO; two-dimensional electron gas (2DEG); X-ray absorption spectroscopy; surface diffraction
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Funding
- Spanish MICINN Agency [CSD2007-00041, MAT2009-09308]
- European Union [264098-MAMA]
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A full understanding of the mechanism of the formation of a two-dimensional electron gas (2DEG) at the interface between insulating LaAlO3 (LAO) thin films and bulk SrTiO3 (STO) crystals is a prerequisite for the full exploitation of this class of materials. Here, by using a combination of advanced X-ray synchrotron-based spectroscopic and structural measurements, it is shown that a structural and electronic reconstruction of the interface occurs before the realization of the 2DEG.
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