Journal
ADVANCED MATERIALS
Volume 24, Issue 44, Pages OP309-+Publisher
WILEY-V C H VERLAG GMBH
DOI: 10.1002/adma.201203033
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Funding
- Volkswagenstiftung
- United Kingdom Engineering and Physical Sciences Research Council through the Quantum Information Processing IRC [GR/S82176/01]
- Hewlett Packard Ltd.
- DIAMANT
- ERC
- EPSRC
- Engineering and Physical Sciences Research Council [EP/F010524/1, EP/F024525/1, GR/S82176/01, EP/E059015/1] Funding Source: researchfish
- EPSRC [EP/F024525/1, EP/E059015/1, EP/F010524/1] Funding Source: UKRI
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Exploring the maximum spatial resolution achievable in far-field optical imaging, we show that applying solid immersion lenses (SIL) in stimulated emission depletion (STED) microscopy addresses single spins with a resolution down to 2.4 +/- 0.3 nm and with a localization precision of 0.09 nm.
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