☆ 4.8 Article

Graphene-Coated Atomic Force Microscope Tips for Reliable Nanoscale Electrical Characterization

ADVANCED MATERIALS (2013)

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Journal

ADVANCED MATERIALS
Volume 25, Issue 10, Pages 1440-1444

Publisher

WILEY-V C H VERLAG GMBH
DOI: 10.1002/adma.201204380

Keywords

graphene; atomic force microscopy; tip wearing; electrochemical metallization; chemical vapor deposition

Categories

Chemistry, Multidisciplinary Chemistry, Physical Nanoscience & Nanotechnology Materials Science, Multidisciplinary Physics, Applied Physics, Condensed Matter

Funding

  1. Major State Basic Research Development Program of China [2011CB013101]
  2. National Natural Science Foundation of China (NSFC) [11225208, 11172001, 10872003, 10932001, 11250110211]
  3. Program for the Author of National Excellent Doctoral Dissertation of China [2007B2]
  4. Spanish Ministry of Science and Innovation [TEC2010-16126]
  5. Generalitat de Catalunya [2009SGR-783, 2010BP-A00135]
  6. NSFC
  7. Alexander von Humboldt (AvH) foundation in Germany

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