Journal
ADVANCED MATERIALS
Volume 24, Issue 8, Pages 1106-1110Publisher
WILEY-V C H VERLAG GMBH
DOI: 10.1002/adma.201103983
Keywords
ferroelectrics; polarization switching; data retention failure; transmission electron microscopy
Categories
Funding
- Department of Energy (DOE) [DE-FG02-07ER46416]
- National Science Foundation [DMR-0907191, DMR-0820404, DMR-0723032]
- Army Research Office [W911NF-10-1-0362]
- National Center for Electron Microscopy at Lawrence Berkeley National Laboratory under the DOE [DE-AC02-05CH11231]
- U.S. Department of Energy (DOE) [DE-FG02-07ER46416] Funding Source: U.S. Department of Energy (DOE)