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High-resolution imaging of gold clusters on KBr(001) surfaces investigated by dynamic scanning force microscopy
C Barth et al.
NANOTECHNOLOGY (2004)
Kelvin probe force microscopy of semiconductor surface defects
Y Rosenwaks et al.
PHYSICAL REVIEW B (2004)
Controlling the charge state of individual gold adatoms
J Repp et al.
SCIENCE (2004)
A non-contact atomic force microscopy and 'force spectroscopy' study of charging on oxide surfaces
CL Pang et al.
NANOTECHNOLOGY (2004)
Electronic properties calculation of MgO thin films adsorbed on semi-infinite Ag(001)
G Butti et al.
PHYSICAL REVIEW B (2004)
Atomically resolved imaging of a CaF bilayer on Si(111): Subsurface atoms and the image contrast in scanning force microscopy
A Klust et al.
PHYSICAL REVIEW B (2004)
Quantitative force measurements in liquid using frequency modulation atomic force microscopy
T Uchihashi et al.
APPLIED PHYSICS LETTERS (2004)
Oxygen-atom vacancies imaged by a noncontact atomic force microscope operated in an atmospheric pressure of N2 gas
A Sasahara et al.
JOURNAL OF PHYSICAL CHEMISTRY B (2004)
Surface structure of Au/InSb(001) system investigated with scanning force microscopy
M Goryl et al.
VACUUM (2004)
Correct height measurement in noncontact atomic force microscopy
S Sadewasser et al.
PHYSICAL REVIEW LETTERS (2003)
Atomic structure of antiphase domain boundaries of a thin Al2O3 film on NiAl(110) -: art. no. 256101
M Kulawik et al.
PHYSICAL REVIEW LETTERS (2003)
Dynamic aspects and associated structures of TiO2(110) and CeO2(111) surfaces relevant to oxide catalyses
K Fukui et al.
PHYSICAL CHEMISTRY CHEMICAL PHYSICS (2003)
Atomic resolution imaging of the (001) surface of UHV cleaved MgO by dynamic scanning force microscopy
C Barth et al.
PHYSICAL REVIEW LETTERS (2003)
Towards chemical identification in atomic-resolution noncontact AFM imaging with silicon tips
AS Foster et al.
PHYSICAL REVIEW B (2003)
Simulating atomic force microscopy imaging of the ideal and defected TiO2 (110) surface -: art. no. 195410
AS Foster et al.
PHYSICAL REVIEW B (2003)
Theories of scanning probe microscopes at the atomic scale
WA Hofer et al.
REVIEWS OF MODERN PHYSICS (2003)
Reactivity of (H+)(e-) color centers at the MgO surface:: formation of O2- and N2- radical anions
D Ricci et al.
SURFACE SCIENCE (2003)
Kelvin probe force microscopy on III-V semiconductors: the effect of surface defects on the local work function
T Glatzel et al.
MATERIALS SCIENCE AND ENGINEERING B-SOLID STATE MATERIALS FOR ADVANCED TECHNOLOGY (2003)
Short-range electrostatic interactions in atomic-resolution scanning force microscopy on the Si(111)7X7 surface -: art. no. 035324
MA Lantz et al.
PHYSICAL REVIEW B (2003)
Advances in atomic force microscopy
FJ Giessibl
REVIEWS OF MODERN PHYSICS (2003)
Interface-reaction-mediated formation of two-dimensional Si islands on CaF2
A Klust et al.
APPLIED PHYSICS LETTERS (2003)
Mechanical vertical manipulation of selected single atoms by soft nanoindentation using near contact atomic force microscopy
N Oyabu et al.
PHYSICAL REVIEW LETTERS (2003)
On the nanoscale measurement of friction using atomic-force microscope cantilever torsional resonances
M Reinstädtler et al.
APPLIED PHYSICS LETTERS (2003)
Amplitude or frequency modulation-detection in Kelvin probe force microscopy
T Glatzel et al.
APPLIED SURFACE SCIENCE (2003)
Determination of site specific interatomic forces between an iron coated tip and the NiO(001) surface by force field spectroscopy
SM Langkat et al.
SURFACE SCIENCE (2003)
Atomic resolution imaging and frequency versus distance measurements on NiO(001) using low-temperature scanning force microscopy -: art. no. 085402
R Hoffmann et al.
PHYSICAL REVIEW B (2003)
Direct determination of the energy required to operate a single molecule switch -: art. no. 066107
C Loppacher et al.
PHYSICAL REVIEW LETTERS (2003)
Charging effect on work function measurements of lithium ceramics under irradiation
GN Luo et al.
JOURNAL OF ALLOYS AND COMPOUNDS (2003)
High resolution atomic force microscopic imaging of the Si(111)-(7x7) surface: Contribution of short-range force to the images - art. no. 256105
T Eguchi et al.
PHYSICAL REVIEW LETTERS (2002)
Role of tip structure and surface relaxation in atomic resolution dynamic force microscopy:: CaF2(111) as a reference surface -: art. no. 235417
AS Foster et al.
PHYSICAL REVIEW B (2002)
Measurement of three-dimensional force fields with atomic resolution using dynamic force spectroscopy
H Hölscher et al.
APPLIED PHYSICS LETTERS (2002)
Imaging of stored charges in Si quantum dots by tapping and electrostatic force microscopy
C Guillemot et al.
EUROPHYSICS LETTERS (2002)
Growth of low-dimensional magnetic nanostructures on an insulator
Z Gai et al.
APPLIED PHYSICS LETTERS (2002)
Electrical contrast observations and voltage measurements by Kelvin probe force gradient microscopy
P Girard et al.
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B (2002)
Lateral-force measurements in dynamic force microscopy -: art. no. 161403
O Pfeiffer et al.
PHYSICAL REVIEW B (2002)
Atomic corrugation in nc-AFM of alkali halides
R Bennewitz et al.
APPLIED SURFACE SCIENCE (2002)
First-principles studies of tip-sample interaction and STM-AFM image formation on TiO2(110)-1x1 and TiO2(110)-1x2 surfaces -: art. no. 125417
SH Ke et al.
PHYSICAL REVIEW B (2002)
Imaging the electrostatic potential of transmembrane channels: Atomic probe microscopy of OmpF porin
A Philippsen et al.
BIOPHYSICAL JOURNAL (2002)
Insulator at the ultrathin limit: MgO on Ag(001)
S Schintke et al.
PHYSICAL REVIEW LETTERS (2001)
Energy dissipation in atomic force microscopy and atomic loss processes -: art. no. 265502
PM Hoffmann et al.
PHYSICAL REVIEW LETTERS (2001)
Electrostatic force microscopy: principles and some applications to semiconductors
P Girard
NANOTECHNOLOGY (2001)
Imaging the atomic arrangements on the high-temperature reconstructed α-Al2O3(0001) surface
C Barth et al.
NATURE (2001)
Atomic force microscopy of biomaterials surfaces and interfaces
KD Jandt
SURFACE SCIENCE (2001)
Single electron tunneling detected by electrostatic force
LJ Klein et al.
APPLIED PHYSICS LETTERS (2001)
Preferential cluster nucleation on long-range superstructures on Al2O3/Ni3Al(111)
C Becker et al.
SURFACE SCIENCE (2001)
Imaging of trapped charge in SiO2 and at the SiO2-Si interface
R Ludeke et al.
APPLIED PHYSICS LETTERS (2001)
Atomic resolution noncontact atomic force and scanning tunneling microscopy of TiO2(110)-(1x1) and -(1x2):: Simultaneous imaging of surface structures and electronic states
M Ashino et al.
PHYSICAL REVIEW LETTERS (2001)
Quantitative measurement of short-range chemical bonding forces
MA Lantz et al.
SCIENCE (2001)
Contrast formation in atomic resolution scanning force microscopy on CaF2(111):: experiment and theory
C Barth et al.
JOURNAL OF PHYSICS-CONDENSED MATTER (2001)
Unambiguous interpretation of atomically resolved force microscopy images of an insulator
AS Foster et al.
PHYSICAL REVIEW LETTERS (2001)
Forces with submolecular resolution between the probing tip and Cu-TBPP molecules on Cu(100) observed with a combined AFM/STM
Ch. Loppacher et al.
APPLIED PHYSICS A-MATERIALS SCIENCE & PROCESSING (2001)
Interpretation of contrast in tapping mode AFM and shear force microscopy. A study of nafion
PJ James et al.
LANGMUIR (2001)
Ionic films on vicinal metal surfaces:: Enhanced binding due to charge modulation
J Repp et al.
PHYSICAL REVIEW LETTERS (2001)
Charge stability on thin insulators studied by atomic force microscopy
N Felidj et al.
EUROPEAN PHYSICAL JOURNAL-APPLIED PHYSICS (2000)
Structure and spectroscopy of surface defects from scanning force microscopy: Theoretical predictions
LN Kantorovich et al.
PHYSICAL REVIEW LETTERS (2000)
Observing single biomolecules at work with the atomic force microscope
A Engel et al.
NATURE STRUCTURAL BIOLOGY (2000)
Piconewton regime dynamic force microscopy in liquid
J Tamayo et al.
APPLIED PHYSICS LETTERS (2000)
Subatomic features on the silicon (111)-(7x7) surface observed by atomic force microscopy
FJ Giessibl et al.
SCIENCE (2000)
Growth of copper and palladium on α-Al2O3(0001)
CL Pang et al.
SURFACE SCIENCE (2000)
Atomically resolved edges and kinks of NaCl islands on Cu(111):: Experiment and theory
R Bennewitz et al.
PHYSICAL REVIEW B (2000)
Local solvation shell measurement in water using a carbon nanotube probe
SP Jarvis et al.
JOURNAL OF PHYSICAL CHEMISTRY B (2000)
Oxidation of Ni3Al(111) at 600, 800, and 1050 K investigated by scanning tunneling microscopy
A Rosenhahn et al.
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A (2000)
Nucleation and growth of supported clusters at defect sites: Pd/MgO(001)
G Haas et al.
PHYSICAL REVIEW B (2000)
Low temperature scanning force microscopy of the Si(111)-(7 x 7) surface
MA Lantz et al.
PHYSICAL REVIEW LETTERS (2000)
Atomic resolution on Si(111)-(7x7) by noncontact atomic force microscopy with a force sensor based on a quartz tuning fork
FJ Giessibl
APPLIED PHYSICS LETTERS (2000)
Atomic-scale structures on a non-stoichiometric TiO2(110) surface studied by noncontact AFM
M Ashino et al.
APPLIED SURFACE SCIENCE (2000)
Structure and properties of NaCl and the Suzuki phase Na6CdCl8
M Chall et al.
JOURNAL OF PHYSICAL CHEMISTRY B (2000)
Phase detection of electrostatic force by AFM with a conductive tip
T Takahashi et al.
ULTRAMICROSCOPY (2000)