Journal
ADVANCED MATERIALS
Volume 22, Issue 32, Pages 3564-+Publisher
WILEY-V C H VERLAG GMBH
DOI: 10.1002/adma.201000766
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Al(2)O(3) thin films deposited at rates as high as 1.2 nm s(-1) using spatially separated atomic layer deposition show excellent solar cell surface passivation properties, i.e., recombination velocities of <2 cm s(-1). This disruptive ALD concept opens the way for cost-effective manufacturing with high industrial throughput numbers.
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