Journal
ADVANCED MATERIALS
Volume 22, Issue 28, Pages 3081-3085Publisher
WILEY-V C H VERLAG GMBH
DOI: 10.1002/adma.201001310
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Funding
- Natural Sciences and Engineering Research Council of Canada (IH)
- Canada Foundation for Innovation (IH)
- National Science Foundation [CHE-0924104
- JS]
- Princeton MRSEC of the National Science Foundation [DMR-0819860
- JS]
- Ministry of Education, Taiwan
- University Science Malaysia
- Direct For Mathematical & Physical Scien
- Division Of Materials Research [819860] Funding Source: National Science Foundation
- Division Of Chemistry
- Direct For Mathematical & Physical Scien [0924104] Funding Source: National Science Foundation
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Excellent device characteristics are measured for a pentacene-based thin film transistor where the SiO2 gate dielectric is terminated with a self-assembled monolayer of 9,10-dinaphthylanthracene-2-phosphonate in which calculated molecular spacings are about 0.7 nm. This creates channels that are on the order of the thickness of an aromatic pi system, which allows intercalation of pentacene units, favoring a pi-stacking motif for this first pentacene layer.
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