4.8 Article

Depletion of PCBM at the Cathode Interface in P3HT/PCBM Thin Films as Quantified via Neutron Reflectivity Measurements

Journal

ADVANCED MATERIALS
Volume 22, Issue 22, Pages 2444-+

Publisher

WILEY-V C H VERLAG GMBH
DOI: 10.1002/adma.200903971

Keywords

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Funding

  1. UK EPSRC [EP/F016433/1]
  2. EPSRC [EP/E046215/1]
  3. Engineering and Physical Sciences Research Council [EP/F016433/1, EP/E046215/1] Funding Source: researchfish
  4. EPSRC [EP/E046215/1, EP/F016433/1] Funding Source: UKRI

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Using neutron reflectivity, self-stratification in a model P3HT/PCBM blend is observed. The as-spun and solvent-annealed films show a depletion of PCBM near the top surface and enrichment of PCBM at the substrate (see figure). Depletion of PCBM at the cathode interface in a photovoltaic device could act as a barrier to efficient electron extraction. On thermal annealing, the PCBM depleted region is eliminated; an effect that partially explains the improvement of P3HT/PCBM devices on thermal annealing.

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