Journal
ADVANCED MATERIALS
Volume 20, Issue 3, Pages 528-+Publisher
WILEY-V C H VERLAG GMBH
DOI: 10.1002/adma.200700887
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A focused ion beam is used to extract cross-sectional samples from multilayer conjugated polymer films and optoelectronic devices. Subsequent TEM, AFM and SIMS studies yield insight into polymer-polymer and polymer-electrode interfaces and how these interfaces can be controlled by processing conditions, such as choice of solvent and thermal annealing.
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